Short-Time Adaline Based Fault Feature Extraction for Inter-Turn Short Circuit Diagnosis of PMSM via Residual Insulation Monitoring

Dong Wei, Kan Liu, Wei Hu 0011, Xiaoyan Peng, Yongdan Chen, Rongjun Ding. Short-Time Adaline Based Fault Feature Extraction for Inter-Turn Short Circuit Diagnosis of PMSM via Residual Insulation Monitoring. IEEE Transactions on Industrial Electronics, 70(3):3103-3114, 2023. [doi]

@article{WeiLHPCD23,
  title = {Short-Time Adaline Based Fault Feature Extraction for Inter-Turn Short Circuit Diagnosis of PMSM via Residual Insulation Monitoring},
  author = {Dong Wei and Kan Liu and Wei Hu 0011 and Xiaoyan Peng and Yongdan Chen and Rongjun Ding},
  year = {2023},
  doi = {10.1109/TIE.2022.3167164},
  url = {https://doi.org/10.1109/TIE.2022.3167164},
  researchr = {https://researchr.org/publication/WeiLHPCD23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {70},
  number = {3},
  pages = {3103-3114},
}