Dynamic void formation in a DD-copper-structure with different metallization geometry

Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont. Dynamic void formation in a DD-copper-structure with different metallization geometry. Microelectronics Reliability, 47(2-3):319-325, 2007. [doi]

Authors

Kirsten Weide-Zaage

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David Dalleau

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Yves Danto

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Hélène Frémont

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