Random Vs. Scenario-based Vs. Fault-based Testing - An Industrial Evaluation of Formal Black-Box Testing Methods - researchr publication authors

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Martin Weiglhofer, Franz Wotawa. Random Vs. Scenario-based Vs. Fault-based Testing - An Industrial Evaluation of Formal Black-Box Testing Methods. In Cesar Gonzalez-Perez, Stefan Jablonski, editors, ENASE 2008 - Proceedings of the 3rd International Conference on Evaluation of Novel Approaches to Software Engineering, Funchal, Madeira, Portugal, May 4-7, 2008. pages 115-122, INSTICC Press, 2008.

This author has not been identified. Look up 'Martin Weiglhofer' in GoogleThis author has not been identified. Look up 'Franz Wotawa' in Google

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