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Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications

P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher. Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. Microelectronics Reliability, 46(8):1279-1284, 2006. [doi]

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P. J. van der Wel

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S. J. C. H. Theeuwen

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J. A. Bielen

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Y. Li

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R. A. van den Heuvel

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J. G. Gommans

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F. van Rijs

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P. Bron

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H. J. F. Peuscher

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