Lee J. Wells, Fadel M. Megahed, Cory B. Niziolek, Jaime A. Camelio, William H. Woodall. Statistical process monitoring approach for high-density point clouds. J. Intelligent Manufacturing, 24(6):1267-1279, 2013. [doi]
@article{WellsMNCW13,
title = {Statistical process monitoring approach for high-density point clouds},
author = {Lee J. Wells and Fadel M. Megahed and Cory B. Niziolek and Jaime A. Camelio and William H. Woodall},
year = {2013},
doi = {10.1007/s10845-012-0665-2},
url = {http://dx.doi.org/10.1007/s10845-012-0665-2},
researchr = {https://researchr.org/publication/WellsMNCW13},
cites = {0},
citedby = {0},
journal = {J. Intelligent Manufacturing},
volume = {24},
number = {6},
pages = {1267-1279},
}