Xiaoqing Wen. LSI Testing: A Core Technology to a Successful LSI Industry. In Fan Ye, Ting-Ao Tang, editors, 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{Wen21-10,
title = {LSI Testing: A Core Technology to a Successful LSI Industry},
author = {Xiaoqing Wen},
year = {2021},
doi = {10.1109/ASICON52560.2021.9620418},
url = {https://doi.org/10.1109/ASICON52560.2021.9620418},
researchr = {https://researchr.org/publication/Wen21-10},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021},
editor = {Fan Ye and Ting-Ao Tang},
publisher = {IEEE},
isbn = {978-1-6654-3867-4},
}