Off-Line Signature Verification Based on Local Structural Pattern Distribution Features

Jing Wen, MoHan Chen, JiaXin Ren. Off-Line Signature Verification Based on Local Structural Pattern Distribution Features. In Shutao Li, Chenglin Liu, Yaonan Wang, editors, Pattern Recognition - 6th Chinese Conference, CCPR 2014, Changsha, China, November 17-19, 2014. Proceedings, Part II. Volume 484 of Communications in Computer and Information Science, pages 499-507, Springer, 2014. [doi]

@inproceedings{WenCR14,
  title = {Off-Line Signature Verification Based on Local Structural Pattern Distribution Features},
  author = {Jing Wen and MoHan Chen and JiaXin Ren},
  year = {2014},
  doi = {10.1007/978-3-662-45643-9_53},
  url = {http://dx.doi.org/10.1007/978-3-662-45643-9_53},
  researchr = {https://researchr.org/publication/WenCR14},
  cites = {0},
  citedby = {0},
  pages = {499-507},
  booktitle = {Pattern Recognition - 6th Chinese Conference, CCPR 2014, Changsha, China, November 17-19, 2014. Proceedings, Part II},
  editor = {Shutao Li and Chenglin Liu and Yaonan Wang},
  volume = {484},
  series = {Communications in Computer and Information Science},
  publisher = {Springer},
  isbn = {978-3-662-45642-2},
}