Charles H.-P. Wen, Onur Guzey, Li-C. Wang. Simulation-based functional test justification using a decision-digram-based Boolean data miner. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 300-307, IEEE, 2006. [doi]
@inproceedings{WenGW06,
title = {Simulation-based functional test justification using a decision-digram-based Boolean data miner},
author = {Charles H.-P. Wen and Onur Guzey and Li-C. Wang},
year = {2006},
url = {http://www.iccd-conference.org/proceedings/2006/paper_117.pdf},
tags = {rule-based, testing, C++},
researchr = {https://researchr.org/publication/WenGW06},
cites = {0},
citedby = {0},
pages = {300-307},
booktitle = {24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA},
publisher = {IEEE},
}