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Nanorobotic Manipulation System for 360° Characterization Atomic Force Microscopy

Yongbing Wen, Haojian Lu, Yajing Shen, Hui Xie 0003. Nanorobotic Manipulation System for 360° Characterization Atomic Force Microscopy. IEEE Transactions on Industrial Electronics, 67(4):2916-2924, 2020. [doi]

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Yongbing Wen

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Haojian Lu

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Yajing Shen

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Hui Xie 0003

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