65 nm sub-threshold logic standard cell library using quasi-Schmitt-trigger design scheme and inverse narrow width effect aware sizing

Liang Wen, Longmei Nan, Jing Zhang, Chunning Meng, Yan Lu, Shiqian Qi, Jianping Lv, Yuejun Zhang. 65 nm sub-threshold logic standard cell library using quasi-Schmitt-trigger design scheme and inverse narrow width effect aware sizing. IET Circuits, Devices & Systems, 14(3):303-310, 2020. [doi]

@article{WenNZMLQLZ20,
  title = {65 nm sub-threshold logic standard cell library using quasi-Schmitt-trigger design scheme and inverse narrow width effect aware sizing},
  author = {Liang Wen and Longmei Nan and Jing Zhang and Chunning Meng and Yan Lu and Shiqian Qi and Jianping Lv and Yuejun Zhang},
  year = {2020},
  doi = {10.1049/iet-cds.2019.0028},
  url = {https://doi.org/10.1049/iet-cds.2019.0028},
  researchr = {https://researchr.org/publication/WenNZMLQLZ20},
  cites = {0},
  citedby = {0},
  journal = {IET Circuits, Devices & Systems},
  volume = {14},
  number = {3},
  pages = {303-310},
}