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Thermographic Data Analysis for Defect Detection by Imposing Spatial Connectivity and Sparsity Constraints in Principal Component Thermography

Ching-Mei Wen, Stefano Sfarra, Gianfranco Gargiulo, Yuan Yao 0002. Thermographic Data Analysis for Defect Detection by Imposing Spatial Connectivity and Sparsity Constraints in Principal Component Thermography. IEEE Trans. Industrial Informatics, 17(6):3901-3909, 2021. [doi]

Authors

Ching-Mei Wen

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Stefano Sfarra

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Gianfranco Gargiulo

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Yuan Yao 0002

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