A Bayesian Method for Fitting Parametric and Nonparametric Models to Noisy Data

Michael Werman, Daniel Keren. A Bayesian Method for Fitting Parametric and Nonparametric Models to Noisy Data. IEEE Trans. Pattern Anal. Mach. Intell., 23(5):528-534, 2001. [doi]

Authors

Michael Werman

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Daniel Keren

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