On N-Shaped I-V Characteristic Devices with Memristive Behavior

Todd Wey. On N-Shaped I-V Characteristic Devices with Memristive Behavior. In 16th IEEE International New Circuits and Systems Conference, NEWCAS 2018, Montréal, QC, Canada, June 24-27, 2018. pages 322-326, IEEE, 2018. [doi]

Authors

Todd Wey

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