Reducing RF Distance Error by Characterizing Multipath

Ann Whitney, Johné M. Parker, Zachary C. N. Kratzer, John Fessler, Julie G. Whitney. Reducing RF Distance Error by Characterizing Multipath. IEEE T. Instrumentation and Measurement, 68(9):3329-3338, 2019. [doi]

@article{WhitneyPKFW19,
  title = {Reducing RF Distance Error by Characterizing Multipath},
  author = {Ann Whitney and Johné M. Parker and Zachary C. N. Kratzer and John Fessler and Julie G. Whitney},
  year = {2019},
  doi = {10.1109/TIM.2018.2875899},
  url = {https://doi.org/10.1109/TIM.2018.2875899},
  researchr = {https://researchr.org/publication/WhitneyPKFW19},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {68},
  number = {9},
  pages = {3329-3338},
}