Control concepts for image-based structure tracking with ultrafast electron beam X-ray tomography

Dominic Windisch, Martina Bieberle, André Bieberle, Uwe Hampel. Control concepts for image-based structure tracking with ultrafast electron beam X-ray tomography. Trans. Inst. Meas. Control, 42(4):691-703, 2020. [doi]

Authors

Dominic Windisch

This author has not been identified. Look up 'Dominic Windisch' in Google

Martina Bieberle

This author has not been identified. Look up 'Martina Bieberle' in Google

André Bieberle

This author has not been identified. Look up 'André Bieberle' in Google

Uwe Hampel

This author has not been identified. Look up 'Uwe Hampel' in Google