Zhaojun Wo, Israel Koren. Technology Mapping for Reliability Enhancement in Logic Synthesis. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 137-142, IEEE Computer Society, 2005. [doi]
@inproceedings{WoK05:1,
title = {Technology Mapping for Reliability Enhancement in Logic Synthesis},
author = {Zhaojun Wo and Israel Koren},
year = {2005},
doi = {10.1109/ISQED.2005.118},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.118},
tags = {logic, reliability},
researchr = {https://researchr.org/publication/WoK05%3A1},
cites = {0},
citedby = {0},
pages = {137-142},
booktitle = {6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2301-3},
}