Automatic Quality Assessment of Reflectance Confocal Microscopy Mosaics using Attention-Based Deep Neural Network

Marek Wodzinski, Miroslawa Pajak, Andrzej Skalski, Alexander Witkowski, Giovanni Pellacani, Joanna Ludzik. Automatic Quality Assessment of Reflectance Confocal Microscopy Mosaics using Attention-Based Deep Neural Network. In 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society, EMBC 2020, Montreal, QC, Canada, July 20-24, 2020. pages 1824-1827, IEEE, 2020. [doi]

@inproceedings{WodzinskiPSWPL20,
  title = {Automatic Quality Assessment of Reflectance Confocal Microscopy Mosaics using Attention-Based Deep Neural Network},
  author = {Marek Wodzinski and Miroslawa Pajak and Andrzej Skalski and Alexander Witkowski and Giovanni Pellacani and Joanna Ludzik},
  year = {2020},
  doi = {10.1109/EMBC44109.2020.9176557},
  url = {https://doi.org/10.1109/EMBC44109.2020.9176557},
  researchr = {https://researchr.org/publication/WodzinskiPSWPL20},
  cites = {0},
  citedby = {0},
  pages = {1824-1827},
  booktitle = {42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society, EMBC 2020, Montreal, QC, Canada, July 20-24, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-1990-8},
}