Hei Wong. Low-frequency noise study in electron devices: review and update. Microelectronics Reliability, 43(4):585-599, 2003. [doi]
@article{Wong03:6,
title = {Low-frequency noise study in electron devices: review and update},
author = {Hei Wong},
year = {2003},
doi = {10.1016/S0026-2714(02)00347-5},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00347-5},
tags = {reviewing},
researchr = {https://researchr.org/publication/Wong03%3A6},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {4},
pages = {585-599},
}