Special Issue on Dynamic Analysis and Testing of Embedded Software

W. Eric Wong, W. K. Chan, T. H. Tse, Fei-Ching Kuo. Special Issue on Dynamic Analysis and Testing of Embedded Software. Journal of Systems and Software, 85(1):1-2, 2012. [doi]

@article{WongCTK12,
  title = {Special Issue on Dynamic Analysis and Testing of Embedded Software},
  author = {W. Eric Wong and W. K. Chan and T. H. Tse and Fei-Ching Kuo},
  year = {2012},
  doi = {10.1016/j.jss.2011.09.044},
  url = {http://dx.doi.org/10.1016/j.jss.2011.09.044},
  researchr = {https://researchr.org/publication/WongCTK12},
  cites = {0},
  citedby = {0},
  journal = {Journal of Systems and Software},
  volume = {85},
  number = {1},
  pages = {1-2},
}