Hei Wong, P. G. Han, M.-C. Poon, Y. Gao. Investigation of the surface silica layer on porous poly-Si thin films. Microelectronics Reliability, 41(2):179-184, 2001. [doi]
@article{WongHPG01,
title = {Investigation of the surface silica layer on porous poly-Si thin films},
author = {Hei Wong and P. G. Han and M.-C. Poon and Y. Gao},
year = {2001},
doi = {10.1016/S0026-2714(00)00098-6},
url = {http://dx.doi.org/10.1016/S0026-2714(00)00098-6},
tags = {C++},
researchr = {https://researchr.org/publication/WongHPG01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {2},
pages = {179-184},
}