Oi-Ying Wong, Wing-Shan Tam, Jun Liu, Oi-Kan Shea, Shiu Hung Cheung, Chi-Wah Kok, Hei Wong. Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors. Microelectronics Reliability, 50(5):627-630, 2010. [doi]
@article{WongTLSCKW10,
title = {Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors},
author = {Oi-Ying Wong and Wing-Shan Tam and Jun Liu and Oi-Kan Shea and Shiu Hung Cheung and Chi-Wah Kok and Hei Wong},
year = {2010},
doi = {10.1016/j.microrel.2010.01.013},
url = {http://dx.doi.org/10.1016/j.microrel.2010.01.013},
tags = {modeling},
researchr = {https://researchr.org/publication/WongTLSCKW10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {5},
pages = {627-630},
}