Critical Issues that Will Determine the Future of RFID

Aaron Wui Lun Wong, Dennis Viehland. Critical Issues that Will Determine the Future of RFID. In International Conference on Mobile Business (ICMB 2007), July 9-11, 2007, Toronto, Ontario, Canada. pages 48, IEEE Computer Society, 2007. [doi]

Authors

Aaron Wui Lun Wong

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Dennis Viehland

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