Mei-Ling Wu, Donald Barker. Rapid assessment of BGA life under vibration and bending, and influence of input parameter uncertainties. Microelectronics Reliability, 50(1):140-148, 2010. [doi]
@article{WuB10-8,
title = {Rapid assessment of BGA life under vibration and bending, and influence of input parameter uncertainties},
author = {Mei-Ling Wu and Donald Barker},
year = {2010},
doi = {10.1016/j.microrel.2009.09.006},
url = {http://dx.doi.org/10.1016/j.microrel.2009.09.006},
researchr = {https://researchr.org/publication/WuB10-8},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {1},
pages = {140-148},
}