Sign ambiguity resolution for phase demodulation in interferometry with application to prelens tear film analysis

Dijia Wu, Kim L. Boyer. Sign ambiguity resolution for phase demodulation in interferometry with application to prelens tear film analysis. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 2807-2814, IEEE, 2010. [doi]

Authors

Dijia Wu

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Kim L. Boyer

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