Yaowen Wu, Christian Bauckhage, Christian Thurau. The Good, the Bad, and the Ugly: Predicting Aesthetic Image Labels. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 1586-1589, IEEE, 2010. [doi]
@inproceedings{WuBT10,
title = {The Good, the Bad, and the Ugly: Predicting Aesthetic Image Labels},
author = {Yaowen Wu and Christian Bauckhage and Christian Thurau},
year = {2010},
doi = {10.1109/ICPR.2010.392},
url = {http://dx.doi.org/10.1109/ICPR.2010.392},
researchr = {https://researchr.org/publication/WuBT10},
cites = {0},
citedby = {0},
pages = {1586-1589},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}