CART-BPN approach for estimating cycle time in wafer fabrication

Hsin-Chieh Wu, Toly Chen. CART-BPN approach for estimating cycle time in wafer fabrication. J. Ambient Intelligence and Humanized Computing, 6(1):57-67, 2015. [doi]

@article{WuC15-0,
  title = {CART-BPN approach for estimating cycle time in wafer fabrication},
  author = {Hsin-Chieh Wu and Toly Chen},
  year = {2015},
  doi = {10.1007/s12652-014-0251-x},
  url = {http://dx.doi.org/10.1007/s12652-014-0251-x},
  researchr = {https://researchr.org/publication/WuC15-0},
  cites = {0},
  citedby = {0},
  journal = {J. Ambient Intelligence and Humanized Computing},
  volume = {6},
  number = {1},
  pages = {57-67},
}