Optimal patch code design via device characterization - researchr publication authors

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Wencheng Wu, Edul N. Dalal. Optimal patch code design via device characterization. In Frans Gaykema, Peter D. Burns, editors, Image Quality and System Performance IX, Burlingame, California, USA, January 22-26, 2012. Volume 8293 of SPIE Proceedings, pages 829311, SPIE, 2012. [doi]

This author has not been identified. Look up 'Wencheng Wu' in GoogleThis author has not been identified. Look up 'Edul N. Dalal' in Google

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