A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors

Xingyi Wu, Yijie Dai, Chen Fu, Xiaobo Zhu, Wenhua Gu, Daying Sun, Wen Wu 0005, Xiaodong Huang, Zhongxiang Shen. A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors. IEEE T. Instrumentation and Measurement, 70:1-9, 2021. [doi]

@article{WuDFZGSWHS21,
  title = {A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors},
  author = {Xingyi Wu and Yijie Dai and Chen Fu and Xiaobo Zhu and Wenhua Gu and Daying Sun and Wen Wu 0005 and Xiaodong Huang and Zhongxiang Shen},
  year = {2021},
  doi = {10.1109/TIM.2021.3109390},
  url = {https://doi.org/10.1109/TIM.2021.3109390},
  researchr = {https://researchr.org/publication/WuDFZGSWHS21},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {70},
  pages = {1-9},
}