Poster Abstract: Using Deep Learning to Classify The Acceleration Measurement Devices - researchr publication authors

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Yuezhong Wu, Carlos Ruiz Dominguez, Shijia Pan, Hae Young Noh, Mahbub Hassan, Pei Zhang 0001, Wen Hu. Poster Abstract: Using Deep Learning to Classify The Acceleration Measurement Devices. In 19th ACM/IEEE International Conference on Information Processing in Sensor Networks, IPSN 2020, Sydney, Australia, April 21-24, 2020. pages 351-352, IEEE, 2020. [doi]

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