A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon contact and its scalability

Yan Wu, Hiroyuki Hasegawa, Kuniyuki Kakushima, Kenji Ohmori, Takanobu Watanabe, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Yoshinori Kataoka, Kenji Natori, Keisaku Yamada, Hiroshi Iwai. A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon contact and its scalability. Microelectronics Reliability, 54(5):899-904, 2014. [doi]

Authors

Yan Wu

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Hiroyuki Hasegawa

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Kuniyuki Kakushima

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Kenji Ohmori

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Takanobu Watanabe

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Akira Nishiyama

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Nobuyuki Sugii

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Hitoshi Wakabayashi

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Kazuo Tsutsui

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Yoshinori Kataoka

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Kenji Natori

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Keisaku Yamada

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Hiroshi Iwai

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