Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana. Antirandom Testing: A Distance-Based Approach. VLSI Design, 2008, 2008. [doi]
@article{WuJMJ08,
title = {Antirandom Testing: A Distance-Based Approach},
author = {Shen Hui Wu and Sridhar Jandhyala and Yashwant K. Malaiya and Anura P. Jayasumana},
year = {2008},
doi = {10.1155/2008/165709},
url = {http://dx.doi.org/10.1155/2008/165709},
tags = {rule-based, testing, systematic-approach},
researchr = {https://researchr.org/publication/WuJMJ08},
cites = {0},
citedby = {0},
journal = {VLSI Design},
volume = {2008},
}