Xiaojun Wu, Lingteng Qiu, Xiaodong Gu, Zhili Long. Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation. IEEE T. Instrumentation and Measurement, 70:1-10, 2021. [doi]
@article{WuQGL21,
title = {Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation},
author = {Xiaojun Wu and Lingteng Qiu and Xiaodong Gu and Zhili Long},
year = {2021},
doi = {10.1109/TIM.2020.3026801},
url = {https://doi.org/10.1109/TIM.2020.3026801},
researchr = {https://researchr.org/publication/WuQGL21},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {70},
pages = {1-10},
}