Jinlin Wu, Hailin Shi, Shu Zhang, Zhen Lei, Yang Yang, Stan Z. Li. De-Mark GAN: Removing Dense Watermark with Generative Adversarial Network. In 2018 International Conference on Biometrics, ICB 2018, Gold Coast, Australia, February 20-23, 2018. pages 69-74, IEEE, 2018. [doi]
@inproceedings{WuSZLYL18,
title = {De-Mark GAN: Removing Dense Watermark with Generative Adversarial Network},
author = {Jinlin Wu and Hailin Shi and Shu Zhang and Zhen Lei and Yang Yang and Stan Z. Li},
year = {2018},
doi = {10.1109/ICB2018.2018.00021},
url = {https://doi.org/10.1109/ICB2018.2018.00021},
researchr = {https://researchr.org/publication/WuSZLYL18},
cites = {0},
citedby = {0},
pages = {69-74},
booktitle = {2018 International Conference on Biometrics, ICB 2018, Gold Coast, Australia, February 20-23, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4285-6},
}