Remaining Useful Life Prediction of Power MOSFETs Using Model-Based and Data-Driven Methods

Jinjing Wu, Zheng Xu, Xiao Wei. Remaining Useful Life Prediction of Power MOSFETs Using Model-Based and Data-Driven Methods. In Zheng Xu 0001, Kim-Kwang Raymond Choo, Ali Dehghantanha, Reza M. Parizi, Mohammad Hammoudeh, editors, Cyber Security Intelligence and Analytics, CSIA 2019, Shenyang, China, 21-22 February 2019. Volume 928 of Advances in Intelligent Systems and Computing, pages 373-381, Springer, 2019. [doi]

@inproceedings{WuXW19-4,
  title = {Remaining Useful Life Prediction of Power MOSFETs Using Model-Based and Data-Driven Methods},
  author = {Jinjing Wu and Zheng Xu and Xiao Wei},
  year = {2019},
  doi = {10.1007/978-3-030-15235-2_56},
  url = {https://doi.org/10.1007/978-3-030-15235-2_56},
  researchr = {https://researchr.org/publication/WuXW19-4},
  cites = {0},
  citedby = {0},
  pages = {373-381},
  booktitle = {Cyber Security Intelligence and Analytics, CSIA 2019, Shenyang, China, 21-22 February 2019},
  editor = {Zheng Xu 0001 and Kim-Kwang Raymond Choo and Ali Dehghantanha and Reza M. Parizi and Mohammad Hammoudeh},
  volume = {928},
  series = {Advances in Intelligent Systems and Computing},
  publisher = {Springer},
  isbn = {978-3-030-15235-2},
}