Chunlei Wu, SuYing Yao, Corinne Bergès. Leakage current study and relevant defect localization in integrated circuit failure analysis. Microelectronics Reliability, 55(3-4):463-469, 2015. [doi]
@article{WuYB15,
title = {Leakage current study and relevant defect localization in integrated circuit failure analysis},
author = {Chunlei Wu and SuYing Yao and Corinne Bergès},
year = {2015},
doi = {10.1016/j.microrel.2015.01.005},
url = {http://dx.doi.org/10.1016/j.microrel.2015.01.005},
researchr = {https://researchr.org/publication/WuYB15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {3-4},
pages = {463-469},
}