Multi-Layer Test and Diagnosis for Dependable NoCs - researchr publication authors

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Hans-Joachim Wunderlich, Martin Radetzki. Multi-Layer Test and Diagnosis for Dependable NoCs. In André Ivanov, Diana Marculescu, Partha Pratim Pande, José Flich, Karthik Pattabiraman, editors, Proceedings of the 9th International Symposium on Networks-on-Chip, NOCS 2015, Vancouver, BC, Canada, September 28-30, 2015. ACM, 2015. [doi]

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