TAIC PART Program. In Phil McMinn, editor, Testing: Academia and Industry Conference - Practice And Research Techniques (TAIC PART 2006), 29-31 August 2006, Windsor, United Kingdom. IEEE Computer Society, 2006. [doi]
@inproceedings{X06e:5,
title = {TAIC PART Program},
year = {2006},
doi = {10.1109/TAIC-PART.2006.25},
url = {http://doi.ieeecomputersociety.org/10.1109/TAIC-PART.2006.25},
researchr = {https://researchr.org/publication/X06e%3A5},
cites = {0},
citedby = {0},
booktitle = {Testing: Academia and Industry Conference - Practice And Research Techniques (TAIC PART 2006), 29-31 August 2006, Windsor, United Kingdom},
editor = {Phil McMinn},
publisher = {IEEE Computer Society},
isbn = {0-7695-2672-1},
}