Test Technology Technical Council (TTTC). In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. IEEE Computer Society, 2006. [doi]
@inproceedings{X06f:21,
title = {Test Technology Technical Council (TTTC)},
year = {2006},
doi = {10.1109/VTS.2006.86},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.86},
tags = {testing},
researchr = {https://researchr.org/publication/X06f%3A21},
cites = {0},
citedby = {0},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}