Keynotes. In Phil McMinn, editor, Testing: Academia and Industry Conference - Practice And Research Techniques (TAIC PART 2006), 29-31 August 2006, Windsor, United Kingdom. IEEE Computer Society, 2006. [doi]
@inproceedings{X06f:4,
title = {Keynotes},
year = {2006},
doi = {10.1109/TAIC-PART.2006.17},
url = {http://doi.ieeecomputersociety.org/10.1109/TAIC-PART.2006.17},
researchr = {https://researchr.org/publication/X06f%3A4},
cites = {0},
citedby = {0},
booktitle = {Testing: Academia and Industry Conference - Practice And Research Techniques (TAIC PART 2006), 29-31 August 2006, Windsor, United Kingdom},
editor = {Phil McMinn},
publisher = {IEEE Computer Society},
isbn = {0-7695-2672-1},
}