Ruiyang Xia, Guoquan Li, Zhengwen Huang, Lingyun Wen, Yu Pang. Classify and Localize Threat Items in X-Ray Imagery With Multiple Attention Mechanism and High-Resolution and High-Semantic Features. IEEE T. Instrumentation and Measurement, 70:1-10, 2021. [doi]
@article{XiaLHWP21,
title = {Classify and Localize Threat Items in X-Ray Imagery With Multiple Attention Mechanism and High-Resolution and High-Semantic Features},
author = {Ruiyang Xia and Guoquan Li and Zhengwen Huang and Lingyun Wen and Yu Pang},
year = {2021},
doi = {10.1109/TIM.2021.3102743},
url = {https://doi.org/10.1109/TIM.2021.3102743},
researchr = {https://researchr.org/publication/XiaLHWP21},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {70},
pages = {1-10},
}