Built-in self-test structure for fault detection of charge-pump phase-locked loop

Lanhua Xia, Jianhui Wu, Cheng Huang, Meng Zhang. Built-in self-test structure for fault detection of charge-pump phase-locked loop. IET Circuits, Devices & Systems, 10(4):317-321, 2016. [doi]

Authors

Lanhua Xia

This author has not been identified. Look up 'Lanhua Xia' in Google

Jianhui Wu

This author has not been identified. Look up 'Jianhui Wu' in Google

Cheng Huang

This author has not been identified. Look up 'Cheng Huang' in Google

Meng Zhang

This author has not been identified. Look up 'Meng Zhang' in Google