Xiaoyu Xiang, Renee Jessome, Eric Maggard, Yousun Bang, Minki Cho, Jan P. Allebach. Blockwise Based Detection of Local Defects. In Nicolas Bonnier, Stuart W. Perry, editors, Image Quality and System Performance XVI, Electronic Imaging 2019, IQSP, Burlingame, CA, USA, 13-17 January 2019. Ingenta, 2019. [doi]
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