Edge computing-based unified condition monitoring system for process manufacturing

Hui Xiao, Wenshan Hu, Guoping Liu 0003, Hong Zhou 0003. Edge computing-based unified condition monitoring system for process manufacturing. Computers & Industrial Engineering, 177:109032, March 2023. [doi]

Authors

Hui Xiao

This author has not been identified. Look up 'Hui Xiao' in Google

Wenshan Hu

This author has not been identified. Look up 'Wenshan Hu' in Google

Guoping Liu 0003

This author has not been identified. Look up 'Guoping Liu 0003' in Google

Hong Zhou 0003

This author has not been identified. Look up 'Hong Zhou 0003' in Google