Jie Xiao, Qiou Ji, Jungang Lou, Ziwen Sun, Yujiao Huang. A Stochastic-Based Reliability Calculation Method for RTL Circuits. In 2020 International Conferences on Internet of Things (iThings) and IEEE Green Computing and Communications (GreenCom) and IEEE Cyber, Physical and Social Computing (CPSCom) and IEEE Smart Data (SmartData) and IEEE Congress on Cybermatics (Cybermatics), iThings/GreenCom/CPSCom/SmartData/Cybermatics 2020, Rhodes Island, Greece, November 2-6, 2020. pages 18-22, IEEE, 2020. [doi]
@inproceedings{XiaoJLSH20,
title = {A Stochastic-Based Reliability Calculation Method for RTL Circuits},
author = {Jie Xiao and Qiou Ji and Jungang Lou and Ziwen Sun and Yujiao Huang},
year = {2020},
doi = {10.1109/iThings-GreenCom-CPSCom-SmartData-Cybermatics50389.2020.00023},
url = {https://doi.org/10.1109/iThings-GreenCom-CPSCom-SmartData-Cybermatics50389.2020.00023},
researchr = {https://researchr.org/publication/XiaoJLSH20},
cites = {0},
citedby = {0},
pages = {18-22},
booktitle = {2020 International Conferences on Internet of Things (iThings) and IEEE Green Computing and Communications (GreenCom) and IEEE Cyber, Physical and Social Computing (CPSCom) and IEEE Smart Data (SmartData) and IEEE Congress on Cybermatics (Cybermatics), iThings/GreenCom/CPSCom/SmartData/Cybermatics 2020, Rhodes Island, Greece, November 2-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-7647-5},
}