Jie Xiao, Jungang Lou, Jianhui Jiang, Xiaoxin Li, Xuhua Yang, Yujiao Huang. Blockchain Architecture Reliability-Based Measurement for Circuit Unit Importance. IEEE Access, 6:15326-15334, 2018. [doi]
@article{XiaoLJLYH18,
title = {Blockchain Architecture Reliability-Based Measurement for Circuit Unit Importance},
author = {Jie Xiao and Jungang Lou and Jianhui Jiang and Xiaoxin Li and Xuhua Yang and Yujiao Huang},
year = {2018},
doi = {10.1109/ACCESS.2018.2800712},
url = {https://doi.org/10.1109/ACCESS.2018.2800712},
researchr = {https://researchr.org/publication/XiaoLJLYH18},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {6},
pages = {15326-15334},
}