Weiwei Xiao, Kechen Song, Jie Liu, Yunhui Yan. Graph Embedding and Optimal Transport for Few-Shot Classification of Metal Surface Defect. IEEE T. Instrumentation and Measurement, 71:1-10, 2022. [doi]
@article{XiaoSLY22,
title = {Graph Embedding and Optimal Transport for Few-Shot Classification of Metal Surface Defect},
author = {Weiwei Xiao and Kechen Song and Jie Liu and Yunhui Yan},
year = {2022},
doi = {10.1109/TIM.2022.3169547},
url = {https://doi.org/10.1109/TIM.2022.3169547},
researchr = {https://researchr.org/publication/XiaoSLY22},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {71},
pages = {1-10},
}