Statistical simulation models for Rayleigh and Rician fading

Chengshan Xiao, Yahong Rosa Zheng, Norman C. Beaulieu. Statistical simulation models for Rayleigh and Rician fading. In Proceedings of IEEE International Conference on Communications, ICC 2003, Anchorage, Alaska, USA, 11-15 May, 2003. pages 3524-3529, IEEE, 2003. [doi]

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