A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits - researchr publication authors

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Jie Xiao 0003, Weidong Zhu, Qing Shen, Haixia Long, Jungang Lou. A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits. IEEE Transactions on Reliability, 72(3):1078-1092, September 2023. [doi]

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