Guoqi Xie, Yuekun Chen, Yan Liu 0032, Renfa Li, Keqin Li 0001. Minimizing Development Cost With Reliability Goal for Automotive Functional Safety During Design Phase. IEEE Transactions on Reliability, 67(1):196-211, 2018. [doi]
@article{XieCLLL18,
title = {Minimizing Development Cost With Reliability Goal for Automotive Functional Safety During Design Phase},
author = {Guoqi Xie and Yuekun Chen and Yan Liu 0032 and Renfa Li and Keqin Li 0001},
year = {2018},
doi = {10.1109/TR.2017.2778070},
url = {https://doi.org/10.1109/TR.2017.2778070},
researchr = {https://researchr.org/publication/XieCLLL18},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {67},
number = {1},
pages = {196-211},
}