Tao Xie, Nikolai Tillmann, Jonathan de Halleux, Wolfram Schulte. Mutation Analysis of Parameterized Unit Tests. In Second International Conference on Software Testing Verification and Validation, ICST 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings. pages 177-181, IEEE Computer Society, 2009. [doi]
@inproceedings{XieTHS09-0,
title = {Mutation Analysis of Parameterized Unit Tests},
author = {Tao Xie and Nikolai Tillmann and Jonathan de Halleux and Wolfram Schulte},
year = {2009},
doi = {10.1109/ICSTW.2009.43},
url = {http://doi.ieeecomputersociety.org/10.1109/ICSTW.2009.43},
researchr = {https://researchr.org/publication/XieTHS09-0},
cites = {0},
citedby = {0},
pages = {177-181},
booktitle = {Second International Conference on Software Testing Verification and Validation, ICST 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3671-2},
}